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Volumn 38, Issue 2, 2005, Pages 113-117
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Surface roughness and dispersion parameters of indium doped amorphous As2Se3 thin films
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Author keywords
Optical properties; Semiconductor; Surface structure; Thin films
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Indexed keywords
AMORPHOUS MATERIALS;
DOPING (ADDITIVES);
EVAPORATION;
INDIUM;
LIGHT TRANSMISSION;
PHOTOVOLTAIC CELLS;
REFRACTIVE INDEX;
SEMICONDUCTOR MATERIALS;
SURFACE ROUGHNESS;
SURFACE STRUCTURE;
THICKNESS MEASUREMENT;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
ENERGY DISPERSION;
OPTICAL CONSTANTS;
OPTICAL ENERGY GAP;
PASS BANDS;
ARSENIC COMPOUNDS;
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EID: 10044265687
PISSN: 09638695
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ndteint.2004.07.002 Document Type: Article |
Times cited : (4)
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References (18)
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