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Volumn 38, Issue 2, 2005, Pages 113-117

Surface roughness and dispersion parameters of indium doped amorphous As2Se3 thin films

Author keywords

Optical properties; Semiconductor; Surface structure; Thin films

Indexed keywords

AMORPHOUS MATERIALS; DOPING (ADDITIVES); EVAPORATION; INDIUM; LIGHT TRANSMISSION; PHOTOVOLTAIC CELLS; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS; SURFACE ROUGHNESS; SURFACE STRUCTURE; THICKNESS MEASUREMENT; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 10044265687     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ndteint.2004.07.002     Document Type: Article
Times cited : (4)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.