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Volumn 5488, Issue PART 2, 2004, Pages 581-592
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A practical system for X-ray interferometry
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Author keywords
Interferometry; X ray
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Indexed keywords
COMPUTATIONAL GEOMETRY;
COMPUTER SIMULATION;
DETECTORS;
DIFFRACTION GRATINGS;
IMAGING TECHNIQUES;
INTERFEROMETRY;
SENSITIVITY ANALYSIS;
X RAY OPTICS;
ANGULAR RESOLUTION;
CONVENTATIONAL GRAZING;
DETECTOR TECHNOLOGY;
X RAY TELESCOPES;
X RAYS;
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EID: 10044265563
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.552917 Document Type: Conference Paper |
Times cited : (19)
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References (10)
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