Transition from PD to electrical tree in solid insulation inferred through enhanced detection tools

Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004

Volumn 2, Issue , 2004, Pages 632-635

  Cavallini, A ^a   Conti, M ^a   Montanari, G C ^a   Contin, A ^b  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b UNIVERSITY OF TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DEFECTS; DIELECTRIC PROPERTIES; ELECTRIC BREAKDOWN; ELECTRIC IMPEDANCE; ELECTRIC INSULATION; FUZZY CONTROL; PARAMETER ESTIMATION; POLYETHYLENES; TREES (MATHEMATICS);

DETECTION TOOLS; ELECTRICAL TREE; PARTIAL DISCHARGES (PD); SOLID INSULATION;

PARTIAL DISCHARGES;

EID: 10044263347     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. R.Bozzo, A.Contin, M.Cacciari, F.Guastavino, G.C.Montanari, "Aging Diagnosis of Insulation Systems by PD Measurements. Extraction of PD Features in Electrical Treeing", IEEE Trans. DEI, vol.5, pp.118-124, 1998.
2. E.Gulski, "Computer-Aided Measurements of PD in HV Equipment", IEEE Trans. EI, vol.28, pp.969-983, 1993.
3. R. Patsch, M. Hoof, "Characteristics of PD Pulse Sequences during Electrical Treeing in Polyethylene", Conf. Proc. IX ISH, v.5, paper 5606, Graz, Austria, September 1995.
4. Suwarno, H. Hichikava, Y.Suzuoki, T.Mizutani, K.Uchida, "PD Patterns of Electrical Treeing in Polyethilene", Conf. Proc. IEEE IPADM, pp.379-382, Brisbane, Australia, July 1994.
5. D.Pepper, W.Kalkner, "PD-Behavior of Electrical Treeing in XLPE at Different Kinds of AC Test Voltages", Conf. Proc. XIIIth ISH, n.02.15, Delft, The Netherlands, August 2003.
6. A.Cavallini, A.Contin, G.C.Montanari, G.Pasini, F.Puletti, "Digital Detection and Fuzzy Classification of PD Signals", IEEE Trans. DEI, vol.9, pp.335-348, 2002.
7. IEC 60270, Partial Discharge Measurements.
8. A.Cavallini, M. Conti, G.C. Montanari, A.Contin, F. Guastavino, F.Ombello, "Early detection of electrical tree through advanced PD measurement inference techniques", Conf. Proc. JICABLE, pp. 612-616, Versailles, France, June 2003.