Measurement and modeling of charge profiles in irradiated dielectrics

Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004

Volumn 2, Issue , 2004, Pages 951-954

  Inguimbert, C ^a   Carrere, Y ^a   Griseri, V ^b   Dirassen, B ^a   Levy, L ^a   Payan, D ^c   Fukunaga, K ^d  

^a ONERA   (France)

^b UNIVERSITÉ PAUL SABATIER   (France)

^c CNES   (France)

^d National Institute of Information and Communications Technology   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; COMPUTER SIMULATION; DIELECTRIC PROPERTIES; ELECTRON IRRADIATION; NUMERICAL METHODS; VACUUM APPLICATIONS;

EXTERNAL COATINGS; IRRADIATED DIELECTRICS; PULSE ELECTRO ACOUSTIC (PEA); VACUUM CHAMBERS;

ELECTRIC DISCHARGES;

EID: 10044261067     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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