External second gate, Fourier transform ion mobility spectrometry: Parametric optimization for detection of weapons of mass destruction

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5403, Issue PART 2, 2004, Pages 395-408

  Tarver, Edward E ^a,b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b Analyt Mat Sciences Department   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL WEAPONDS CONVENTION (CWC); GATING GRIDS; ION MOBILITY SPECTROMETRY; PARAMETRIC OPTIMIZATION;

DATA REDUCTION; EXPLOSIVES; FOURIER TRANSFORMS; IONIZATION; IONS; OPTIMIZATION; PRESSURE EFFECTS; SENSITIVITY ANALYSIS;

SPECTROMETRY;

EID: 10044258704     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.546800     Document Type: Conference Paper

References (8)

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