The constellation-X RGS options: Raytrace modeling of the off-plane gratings

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5488, Issue PART 2, 2004, Pages 515-529

  Flanagan, K A ^a   Davis, J E ^a   Heilmann, R K ^a   Levine, A M ^a   McGuirk, M ^a   Ricker, G R ^a   Schattenburg, M L ^a   Wise, M ^a,b   Rasmussen, A ^b   Bookbinder, J ^c   Freeman, M ^c   Gaetz, T ^c   Jerius, D ^c   Nguyen, D ^c   Podgorski, W ^c   Reid, P ^c   Cash, W ^d   Shipley, A ^d   Gallagher, D ^e   Huang, P ^e   Jordan, S ^e   more..

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b Och Spine at New York Presbyterian Hospitals   (United States)

^c SMITHSONIAN ASTROPHYSICAL OBSERVATORY   (United States)

^d UNIVERSITY OF COLORADO   (United States)

^e BALL AEROSPACE AND TECHNOLOGIES CORP   (United States)

Author keywords

CCD; Diffraction; High resolution; Off plane grating; Reflection gratings; Spectrometer; X ray

Indexed keywords

CALORIMETERS; CHARGE COUPLED DEVICES; DIFFRACTION GRATINGS; LIGHT; MATHEMATICAL MODELS; RAY TRACING; SPECTROMETERS; X RAYS;

FOCAL PLANE CAMERA (FPC); HIGH RESOLUTION; OFF-PLANE GRATING; REFLECTION GRATINGS;

REFLECTION;

EID: 10044253434     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.551766     Document Type: Conference Paper

References (11)

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