Instrumentation for ground test of super agile detectors and front-end electronics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5488, Issue PART 2, 2004, Pages 719-730

  Pacciani, L ^a   Porrovecchio, G ^a   Barbanera, L ^a   Costa, E ^a   Del Monte, E ^a   Di Persio, G ^a   Donnarumma, I ^a   Feroci, M ^a   Lazzarotto, F ^a   Uberti, O ^a   Rubini, A ^a   Soffitta, P ^a   Bulgarelli, A ^b   Gianotti, F ^b   Morelli, E ^b   Trifoglio, M ^b   Mastropietro, M ^c  

^a INAF IASF ROMA   (Italy)

^b OSSERVATORIO ASTRONOMICO DI BOLOGNA   (Italy)

^c CNR   (Italy)

Author keywords

ASIC; Data reduction; Fast DAQ; FEE; PC Linux; Silicon microstrip detectors; Test Equipment; VME

Indexed keywords

AMPLIFIERS (ELECTRONIC); APPLICATION SPECIFIC INTEGRATED CIRCUITS; COMPUTER SOFTWARE; DATA ACQUISITION; DATA REDUCTION; GRAPHICAL USER INTERFACES; NETWORK PROTOCOLS; OPTIMIZATION; RESISTORS; SIGNAL TO NOISE RATIO;

FAST DAQ; FRONT-END ELECTRONICS (FEE); PC-LINUX; SILICON MICROSTRIP DETECTORS; VME;

SENSORS;

EID: 10044251367     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.557896     Document Type: Conference Paper

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