SVM-based classifier design with controlled confidence

Proceedings - International Conference on Pattern Recognition

Volumn 1, Issue , 2004, Pages 164-167

  Li, Mingkun ^a   Sethi, Ishwar K ^a  

^a Oakland University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATABASE SYSTEMS; ERROR ANALYSIS; PARAMETER ESTIMATION; PATTERN RECOGNITION; PROBABILITY; PROBLEM SOLVING; VECTORS;

ERROR RATES; HISTOGRAMS; SUPPORT VECTOR MACHINES (SVM);

CLASSIFIERS;

EID: 10044250921     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/icpr.2004.1334037     Document Type: Conference Paper

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