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Volumn 85, Issue 3, 2005, Pages 407-413

Measurement of CuInSe2 solar cell AC parameters

Author keywords

AC parameters; CuInSe2; Solar cell

Indexed keywords

CAPACITANCE; CONTROL EQUIPMENT; COPPER COMPOUNDS; PERMITTIVITY; PHOTOVOLTAIC EFFECTS; POWER GENERATION; SEMICONDUCTOR DOPING;

EID: 10044248343     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2004.05.018     Document Type: Article
Times cited : (9)

References (7)
  • 3
    • 0018467981 scopus 로고
    • Measurement of Minority carrier lifetime in solar cells from photo-induced open circuit voltage decay
    • J.E. Mahan, W.E. Thomas, I.F. Robert, K. Roy, Measurement of Minority carrier lifetime in solar cells from photo-induced open circuit voltage decay, IEEE Trans. Electron. Devices. 26 (5) (1979) 733-739.
    • (1979) IEEE Trans. Electron. Devices. , vol.26 , Issue.5 , pp. 733-739
    • Mahan, J.E.1    Thomas, W.E.2    Robert, I.F.3    Roy, K.4
  • 6
    • 0019624188 scopus 로고
    • Depletion layer effects in the open circuit voltage decay lifetime measurement
    • J.E. Mahan, D.L. Barnes, Depletion layer effects in the open circuit voltage decay lifetime measurement, Solid State Electron. 24 (10) (1981) 989-994.
    • (1981) Solid State Electron. , vol.24 , Issue.10 , pp. 989-994
    • Mahan, J.E.1    Barnes, D.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.