Damage detection by applying statistical methods to PZT impedance measurements

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5390, Issue , 2004, Pages 513-520

  Allen, David W ^a   Peairs, Daniel M ^a   Inman, Daniel J ^a  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

Damage identification; Impedance method; Integrated systems; Smart materials; Statistical process control; Structural health monitoring

Indexed keywords

DAMAGE DETECTION; DAMAGE IDENTIFICATION; HEALTH MONITORING SYSTEMS; IMPEDANCE METHODS;

ALGORITHMS; BUILDINGS; EARTHQUAKE EFFECTS; MONITORING; OPTIMIZATION; PROCESS CONTROL; STATISTICAL METHODS;

PIEZOELECTRICITY;

EID: 10044236755     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.539830     Document Type: Conference Paper

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