메뉴 건너뛰기




Volumn 53, Issue 2, 2005, Pages 297-302

Accurate determination of domain boundary orientation in LaNbO4

Author keywords

Ceramics; Electron diffraction; High resolution electron microscopy; Interface structure; X ray diffraction

Indexed keywords

CERAMIC MATERIALS; ELECTRON DIFFRACTION; ENERGY DISPERSIVE SPECTROSCOPY; HIGH RESOLUTION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); POLYCRYSTALLINE MATERIALS; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 10044236349     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2004.09.023     Document Type: Article
Times cited : (30)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.