Signal loss, spatial resolution, and sensitivity of long coaxial crack sensors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5391, Issue , 2004, Pages 786-797

  Sun, Shishuang ^a   Pommerenke, David ^a   Drewniak, James L ^b   Chen, Genda ^a  

^a University of Missouri Rolla   (United States)

^b MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

Author keywords

Dielectric loss; Multiple signal reflections; Sensitivity; Signal loss; Skin effect; Spatial resolution

Indexed keywords

CATHODE RAY OSCILLOSCOPES; CRACKS; DIELECTRIC LOSSES; ELECTRIC POTENTIAL; OPTICAL RESOLVING POWER; REINFORCED CONCRETE;

COAXIAL CRACK SENSORS; MULTIPLE SIGNAL REFLECTIONS; SPATIAL RESOLUTION;

SENSORS;

EID: 10044235360     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.540033     Document Type: Conference Paper

References (9)

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