-
1
-
-
0342293710
-
A process for detecting defects in complicated patterns
-
M. Ejiri, T. Uno, M. Mese and S. Ikeda, "A Process for Detecting Defects in Complicated Patterns," Computer Graphics and Image Processing, Vol.2, No.3-4, 1973, pp. 326-339.
-
(1973)
Computer Graphics and Image Processing
, vol.2
, Issue.3-4
, pp. 326-339
-
-
Ejiri, M.1
Uno, T.2
Mese, M.3
Ikeda, S.4
-
2
-
-
0016990154
-
A transistor wire-bonding system utilizing multiple local pattern matching techniques
-
Oct.
-
S. Kashioka, M. Ejiri and Y. Sakamoto, "A Transistor Wire-Bonding System Utilizing Multiple Local Pattern Matching Techniques," IEEE Trans. on SMC, Vol.SMC-6, No.8, Oct. 1977, pp. 562-570.
-
(1977)
IEEE Trans. on SMC
, vol.SMC-6
, Issue.8
, pp. 562-570
-
-
Kashioka, S.1
Ejiri, M.2
Sakamoto, Y.3
-
3
-
-
0023830565
-
An automatic wafer inspection system using pipelined image processing techniques
-
H. Yoda, Y. Ohuchi, Y. Taniguchi and M. Ejiri, "An Automatic Wafer Inspection System Using Pipelined Image Processing Techniques," IEEE Trans. on PAMI, Vol. PAMI-10, No,10, 1988, pp.4-16.
-
(1988)
IEEE Trans. on PAMI
, vol.PAMI-10
, Issue.10
, pp. 4-16
-
-
Yoda, H.1
Ohuchi, Y.2
Taniguchi, Y.3
Ejiri, M.4
-
4
-
-
0024680639
-
Knowledge-directed inspection for complex multilayered patterns
-
M. Ejiri, H. Yoda, H.Sakou and Y. Sakamoto, "Knowledge-Directed Inspection for Complex Multilayered Patterns," Machine Vision and Applications, vol.2, no.3, 1989, pp.155-166.
-
(1989)
Machine Vision and Applications
, vol.2
, Issue.3
, pp. 155-166
-
-
Ejiri, M.1
Yoda, H.2
Sakou, H.3
Sakamoto, Y.4
-
6
-
-
0038820943
-
Recognition strategies for Japanese mailpiece recipient addresses
-
H. Fujisawa, M. Koga, H. Ogata, T. Kagehiro and H. Sako, "Recognition Strategies for Japanese Mailpiece Recipient Addresses," Proc. of 2nd International Conference on Multimodal Interface (ICMI '99), 1999, pp. III69-74.
-
(1999)
Proc. of 2nd International Conference on Multimodal Interface (ICMI '99)
-
-
Fujisawa, H.1
Koga, M.2
Ogata, H.3
Kagehiro, T.4
Sako, H.5
-
8
-
-
10044283433
-
Form reading based on form-type identification and form-data recognition
-
H. Sako, M. Seki, N. Furukawa, H. Ikeda and A. Imaizumi, "Form Reading based on Form-type Identification and Form-data Recognition," Proc. of International Conference on Document Analysis and Recognition (ICDAR 2003), 2003. pp. 926-930.
-
(2003)
Proc. of International Conference on Document Analysis and Recognition (ICDAR 2003)
, pp. 926-930
-
-
Sako, H.1
Seki, M.2
Furukawa, N.3
Ikeda, H.4
Imaizumi, A.5
-
9
-
-
10044256900
-
-
Discussion with Prof. Andreas Dengel, DFKI
-
Discussion with Prof. Andreas Dengel, DFKI
-
-
-
-
10
-
-
0000326230
-
Real-time facial-feature tracking based on matching techniques and its applications
-
H. Sako, M. Whitehouse, A. Smith and A. Sutherland, "Real-Time Facial-Feature Tracking Based on Matching Techniques and its Applications" Proc. of International Conference on Pattern Recognition (ICPR '94), 1994, pp. 320-324.
-
(1994)
Proc. of International Conference on Pattern Recognition (ICPR '94)
, pp. 320-324
-
-
Sako, H.1
Whitehouse, M.2
Smith, A.3
Sutherland, A.4
-
11
-
-
0033888070
-
An introduction to evaluating biometric systems
-
Feb.
-
P. J. Phillips, A. Martin C. L. Wilson and M. Przybocki, "An Introduction to Evaluating Biometric Systems," IEEE Computer, Vol.33, No.2, Feb. 2000, pp. 56-63.
-
(2000)
IEEE Computer
, vol.33
, Issue.2
, pp. 56-63
-
-
Phillips, P.J.1
Martin, A.2
Wilson, C.L.3
Przybocki, M.4
-
12
-
-
0033879165
-
Biometrics: The future of identification
-
Feb.
-
S. Pankanti, R. M. Bolle and A. Jain, "Biometrics: The Future of Identification," IEEE Computer, Vol.33, No.2, Feb. 2000, pp. 46-49.
-
(2000)
IEEE Computer
, vol.33
, Issue.2
, pp. 46-49
-
-
Pankanti, S.1
Bolle, R.M.2
Jain, A.3
|