Signal processing techniques for damage detection with piezoelectric wafer active sensors and embedded ultrasonic structural radar

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5391, Issue , 2004, Pages 492-503

  Yu, Lingyu ^a   Bao, Jingjing ^b   Giurgiutiu, Victor ^a  

^a University of South Carolina   (United States)

^b Racer Technology Limited Co   (China)

Author keywords

Cross correlation; De noising; Embedded sensors; Filtering; Hilbert transform; Nondestructive evaluation; Piezoelectric; Piezoelectric wafer active sensor; PWAS; Signal processing; Structure health monitoring; Time of flight; TOF; Wavelet transform

Indexed keywords

CROSS CORRELATION; DAMAGE DETECTION; DE-NOISING; EMBEDDED SENSORS; HILBERT TRANSFORMS; PIEZOELECTRIC WAFER ACTIVE SENSOR; PWAS; STRUCTURAL HEALTH MONITORING; TIME OF FLIGHT; TOF;

CORROSION; CRACKS; EMBEDDED SYSTEMS; PIEZOELECTRIC MATERIALS; SENSORS; SIGNAL PROCESSING; ULTRASONICS; WAVELET TRANSFORMS;

NONDESTRUCTIVE EXAMINATION;

EID: 10044230737     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.540512     Document Type: Conference Paper

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