Uncertainties in the minimum resolvable temperature difference measurement

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5407, Issue , 2004, Pages 1-7

  Sousk, Stephen ^a   O'Shea, Patrick ^a   Van Hodgkin, ^a  

^a U S ARMY   (United States)

Author keywords

Fixed pattern noise; Imaging system performance; Infrared systems testing; Measurements; Minimum resolvable temperature difference; MRT simulator uncertainty

Indexed keywords

FIXED PATTERN NOISE; IMAGING SYSTEM PERFORMANCE; INFRARED SYSTEMS TESTING; MINIMUM RESOLVABLE TEMPERATURE DIFFERENCE; MRT UNCERTAINITY;

ACOUSTIC NOISE; ATMOSPHERIC HUMIDITY; IMAGE QUALITY; IMAGING SYSTEMS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; SENSITIVITY ANALYSIS; THERMOANALYSIS;

INFRARED IMAGING;

EID: 10044230525     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.541352     Document Type: Conference Paper

References (4)

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3. J.M. Mooney, "Staring sensor MRT measurement and modeling", SPIE, Vol 1540, 550-564, 1991.
4. F. A. Resell, R. H. Willson, "Recent psychophysical experiments and display signal-to-noise ratio concept," Perception of Displayed Information, Plenum Press, New York, 1973.