A Computer-aided inspection planning system for on-machine measurement - Part I: Global inspection planning

KSME International Journal

Volumn 18, Issue 8, 2004, Pages 1349-1357

  Lee, Honghee ^a   Cho, Myeong Woo ^a   Yoon, Gil Sang ^a   Choi, Jin Hwa ^a  

^a Inha University   (South Korea)

Author keywords

Computer Aided Inspection Planning (CAIP); Feature Group; Geometric Feature; On Machine Measurement (OMM)

Indexed keywords

ALGORITHMS; COMPUTATIONAL GEOMETRY; COMPUTER AIDED MANUFACTURING; FEATURE EXTRACTION; HEURISTIC METHODS; PRODUCT DESIGN; STATISTICAL METHODS;

COMPUTER-AIDED INSPECTION PLANNING (CAIP); FEATURE GROUP; GEOMETRIC FEATURES; ON MACHINE MEASUREMENT (OMM);

COMPUTER AIDED DESIGN;

EID: 10044226233     PISSN: 12264865     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02984249     Document Type: Article

References (11)

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