Electrical properties and defect structure of niobia-doped ceria

Solid State Ionics

Volumn 175, Issue 1-4, 2004, Pages 341-344

  Yashiro, K ^a   Suzuki, T ^a   Kaimai, A ^a   Matsumoto, H ^a   Nigara, Y ^a   Kawada, T ^a   Mizusaki, J ^a   Sfeir, J ^b   Van Herle, J ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b EPFL   (Switzerland)

Author keywords

Defect association; Defect equilibrium; Electrical conductivity; Nb doped ceo2

Indexed keywords

ACTIVATION ENERGY; DEFECTS; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; NIOBIUM COMPOUNDS; OXIDATION; PARTIAL PRESSURE; SOLID OXIDE FUEL CELLS;

DEFECT ASSOCIATION; DEFECT EQUILIBRIUM; ELECTRONIC CONDUCTION; NB-DOPED CEO2;

CERIUM COMPOUNDS;

EID: 10044225834     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2004.01.066     Document Type: Conference Paper

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