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Volumn 36, Issue 4-6, 2004, Pages 833-847

Self-organized domain formation in low-dislocation-density GaN

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CATHODOLUMINESCENCE; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); IMPURITIES; METALLORGANIC VAPOR PHASE EPITAXY; SILICON NITRIDE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 10044222304     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.spmi.2004.09.039     Document Type: Article
Times cited : (16)

References (76)
  • 57
    • 10044295981 scopus 로고    scopus 로고
    • B. Beaumont, J.-P. Faurie, P. Gibart, WO 2004/012227
    • B. Beaumont, J.-P. Faurie, P. Gibart, WO 2004/012227.
  • 70
    • 10044265214 scopus 로고    scopus 로고
    • K. Motoki, T. Okahisa, S. Nakahata, N Matsumoto, H. Kimura, H. Ksai, K. Takemoto, K. Uematsu, M. Ueno, Y. Kumagai, A. Koukitu, H. Seki, J. Cryst Growth 237-239 (2002) 912; Mater. Sci. Eng. B93 (2002) 123.
    • (2002) Mater. Sci. Eng. , vol.B93 , pp. 123


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.