The electron transport properties of photo- and electron-beam-irradiated C60 films

Journal of Physics and Chemistry of Solids

Volumn 65, Issue 2-3, 2004, Pages 343-348

  Onoe, Jun ^a,b   Nakayama, Tomonobu ^c   Aono, Masakazu ^c   Hara, Toshiki ^d  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^d SEIKO EPSON CORPORATION   (Japan)

Author keywords

A. Fullerenes; A. Nanostructures; A. Polymers; C. Ab initio calculations; D. Electrical conductivity

Indexed keywords

CHEMICAL BONDS; DIMERS; ELECTRIC CONDUCTIVITY; ELECTRON BEAMS; ELECTRON IRRADIATION; ELECTRON TRANSPORT PROPERTIES; ELECTRONIC STRUCTURE; NANOTECHNOLOGY; PHOTOPOLYMERIZATION; PROBABILITY DENSITY FUNCTION; SUBLIMATION;

FULLERIDES; PHOTOIRRADIATION; SCANNING PROBE MICROSCOPY;

FULLERENES;

EID: 0942289613     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2003.08.040     Document Type: Conference Paper

References (21)

1. Rao A.M., Zhou P., Wang K.-A., Hager G.T., Holden J.M., Wang Y., Lee W.-T., Bi X.-X., Eklund P.C., Cornett D.S., Duncan M.A., Amster I.J. Science. 259:1993;955.
2. Rao A.M., Eklund P.C. Eklund P.C., Rao A.M. Fullerene Polymers and Fullerene Polymer Composites. 2000;145 Springer, Berlin.
3. Onoe J., Takeuchi K. Phys. Rev. B. 54:1996;6167.
4. Esfarjani K., Hashi Y., Onoe J., Takeuchi K., Kawazoe Y. Phys. Rev. B. 57:1998;223.
5. Onoe J., Nakao A., Takeuchi K. Phys. Rev. B. 55:1997;10051.
6. Onoe J., Takeuchi K. Phys. Rev. Lett. 79:1997;2987.
7. Nakayama T., Onoe J., Takeuchi K., Aono M. Phys. Rev. B. 59:1999;12627.
8. Nakayama T., Onoe J., Nakatsuji K., Nakamura J., Takeuchi K., Aono M. Surf. Rev. Lett. 6:1999;1073.
9. Okada S., Saito S. Phys. Rev. B. 59:1999;1930.
10. Hara T., Onoe J., Tanaka H., Li Y., Takeuchi K. Jpn. J. Appl. Phys. 39:2000;1872.
11. Onoe J., Nakayama T., Aono M., Hara T. Appl. Phys. Lett. 82:2003;595.
12. Wen C., Li J., Kitazawa K., Aida T., Honma I., Komiyama H., Yamada K. Appl. Phys. Lett. 61:1992;2162.
13. 60.
14. The present DFT calculations were carried out using the Amsterdam density-functional program (ADF 2.3.0, Theoretical Chemistry, Vrije Universiteit, Amsterdam).
15. Hara T., Onoe J., Takeuchi K. Phys. Rev. B. 63:2001;115412.
16. Wang G., Komatsu K., Murata Y., Shiro M. Nature. 387:1997;583.
17. Strout D.L., Murry D.L., Xu C., Eckhoff W.C., Odom G.K., Scuseria G.E. Chem. Phys. Lett. 214:1993;576.
18. Choi C.H., Kertesz M. Chem. Phys. Lett. 282:1998;318.
19. st. Here, V is the voltage difference between the inner two probes and I is the current flow between the outer two probes.
20. 60 film. The carriers of the film are apparently supplied by the biased metal probe during this measurement.
21. Kremer R.K. Appl. Phys. A. 56:1993;211.