Structure and electronic properties of ultrathin Co films on W(1 1 0)

Surface Science

Volumn 550, Issue 1-3, 2004, Pages 223-232

  Pratzer, M ^a   Elmers, H J ^a  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

Author keywords

Cobalt; Growth; Magnetic; Scanning tunneling microscopy; Scanning tunneling spectroscopies; Surface electronic phenomena (work function, surface potential, surface states, etc.); Surface structure, morphology, roughness, and topography; Tungsten

Indexed keywords

AGGLOMERATION; CYCLOTRON RESONANCE; ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; INTERFACIAL ENERGY; LOW ENERGY ELECTRON DIFFRACTION; MAGNETIC THIN FILMS; MOLECULAR BEAM EPITAXY; MORPHOLOGY; PHASE TRANSITIONS; PHOTOELECTRON SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; SUBSTRATES; SURFACE ROUGHNESS; THERMAL EFFECTS; THERMODYNAMIC STABILITY;

MAGNETIC PHENOMENA; SCANNING TUNNELING SPECTROSCOPY (STS); SURFACE ELECTRONIC PHENOMENA; SURFACE STATES; WORK FUNCTIONS;

COBALT;

EID: 0942289558     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2003.12.032     Document Type: Article

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