Origin of the deviation of intermodulation distortion in high-Tc thin films from the classical 3:1 scaling

Superconductor Science and Technology

Volumn 17, Issue 1, 2004, Pages 1-7

  Velichko, A V ^a  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC IMPEDANCE; HIGH TEMPERATURE SUPERCONDUCTORS; INTEGRAL EQUATIONS; MAGNETIC FIELDS; MATHEMATICAL MODELS; MICROWAVES; POLYNOMIALS; SURFACE PROPERTIES; YTTRIUM BARIUM COPPER OXIDES;

FOURIER INTEGRAL METHOD; HIGH TEMPERATURE SUPERCONDUCTING THIN FILMS; INTERMODULATION DISTORTION; MICROWAVE MAGNETIC FIELD; MICROWAVE POWER DEPENDENCE; SURFACE IMPEDANCE;

THIN FILMS;

EID: 0942288930     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/17/1/001     Document Type: Article

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