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Volumn 58, Issue 7-8, 2004, Pages 1209-1211
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Effect of low angle grain boundaries on detection characteristics of trans-stilbene crystals
a
ANNA UNIVERSITY
(India)
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Author keywords
Crystal growth; Defect; Low angle grain boundary; Organic compounds; Scintillator; Vertical Bridgman Technique
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Indexed keywords
ANISOTROPY;
CALIBRATION;
CRYSTAL GROWTH;
CRYSTALLOGRAPHY;
DEFECTS;
GRAIN BOUNDARIES;
LUMINESCENCE;
ORGANIC COMPOUNDS;
PHOSPHORS;
SCINTILLATION;
THERMONUCLEAR REACTIONS;
X RAY ANALYSIS;
LOW ANGLE GRAIN BOUNDARY;
VERTICAL BRIDGMAN TECHNIQUE;
X-RAY ROCKING ANALYSIS;
CRYSTALS;
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EID: 0942288472
PISSN: 0167577X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.matlet.2003.08.036 Document Type: Article |
Times cited : (9)
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References (20)
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