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Volumn 17, Issue 1, 2004, Pages 87-88
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Estimating true level in a thickener using a conductivity probe
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Author keywords
On line analysis; Thickening
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Indexed keywords
CALIBRATION;
ELECTRIC CONDUCTANCE;
ELECTRIC CONDUCTIVITY;
ELECTRODES;
ESTIMATION;
INTERFACES (MATERIALS);
PROBES;
ON-LINE ANALYSIS;
THICKENING;
MINERALOGY;
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EID: 0942278996
PISSN: 08926875
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mineng.2003.10.006 Document Type: Article |
Times cited : (7)
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References (3)
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