메뉴 건너뛰기




Volumn 17, Issue 1, 2004, Pages 87-88

Estimating true level in a thickener using a conductivity probe

Author keywords

On line analysis; Thickening

Indexed keywords

CALIBRATION; ELECTRIC CONDUCTANCE; ELECTRIC CONDUCTIVITY; ELECTRODES; ESTIMATION; INTERFACES (MATERIALS); PROBES;

EID: 0942278996     PISSN: 08926875     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mineng.2003.10.006     Document Type: Article
Times cited : (7)

References (3)
  • 2
    • 80051793933 scopus 로고    scopus 로고
    • Strategies for instrumentation and control of thickeners and other solid-liquid separation circuits
    • A.L. Mular, D.N. Halbe, Barratt D.J. Littleton, CO: SME
    • Schoenmann F., Hales L., Bedell D. Strategies for instrumentation and control of thickeners and other solid-liquid separation circuits. Mular A.L., Halbe D.N., Barratt D.J. Mineral Processing Plant Design, Practice, and Control. vol. 2:2002;2164-2173 SME, Littleton, CO.
    • (2002) Mineral Processing Plant Design, Practice, and Control , vol.2 , pp. 2164-2173
    • Schoenmann, F.1    Hales, L.2    Bedell, D.3
  • 3
    • 0042060294 scopus 로고
    • Level and solids profile detection in thickeners using conductivity
    • Xu M., Probst A., Finch J.A. Level and solids profile detection in thickeners using conductivity. C.I.M. Bull. 87(985):1994;46-52.
    • (1994) C.I.M. Bull. , vol.87 , Issue.985 , pp. 46-52
    • Xu, M.1    Probst, A.2    Finch, J.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.