The role of C-impurities in alumina dielectrics

Journal of the European Ceramic Society

Volumn 24, Issue 6, 2004, Pages 1513-1516

  Vila, R ^a   Gonzalez M ^a   Hernandez M T ^a   Molla J ^a  

^a CIEMAT   (Spain)

Author keywords

Al2O3; Carbon doping; Dielectric properties; Electric properties; Hot pressing; Microstructure final

Indexed keywords

ALUMINA; CARBON; DIELECTRIC LOSSES; FUSION REACTORS; HOT PRESSING; IMPURITIES; MOLECULAR STRUCTURE; OXIDATION; SCANNING ELECTRON MICROSCOPY; SINTERING; TRANSMISSION ELECTRON MICROSCOPY;

OXIDISED MICROSTRUCTURES;

DIELECTRIC MATERIALS;

DIELECTRIC PROPERTY;

EID: 0942278168     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(03)00571-5     Document Type: Article

References (5)

1. Landa, A. R., Gonzalez, M. and Hernandez, M. T., Carbon microstructure on grain boundaries of corundum. 3th Int. Conf. On Inorg. Materials, Konstanz, Germany, 2002.
2. ASTM standard designation C20-87.
3. Unpublished results.
4. Mollá, J. and Ibarra, A., A System for the Measurement of Dialectic Properties of Insulator Materials Report EUR-CIEMAT Vol. 89/13, 1989.
5. Kakimoto A. Etoh A. Hirano K. Nonaka S. Rev. Sci. Instrum. 58 2 1987 269