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Volumn 518, Issue 1-2, 2004, Pages 82-85

An extensive aging study of bakelite Resistive Plate Chambers

Author keywords

Bakelite; Current; Detector; Humid gas; Resistivity; RPC

Indexed keywords

ATMOSPHERIC HUMIDITY; DEGRADATION; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRODES; ELECTRONIC EQUIPMENT; GAMMA RAYS; IRRADIATION; MATHEMATICAL MODELS; PHOTONS;

EID: 0942277321     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.10.030     Document Type: Conference Paper
Times cited : (10)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.