메뉴 건너뛰기




Volumn 6, Issue 1, 2004, Pages 121-126

Measurement method of spatial straightness error using non-diffracting beam and moiré-fringe technology

Author keywords

Axicon; Moir fringe; Non diffracting beam; Ring grating; Spatial straightness error

Indexed keywords

APPROXIMATION THEORY; BESSEL FUNCTIONS; DENSITY (OPTICAL); DIFFRACTION GRATINGS; LASER BEAMS; MOIRE FRINGES; OPTICAL FILTERS; REFRACTIVE INDEX;

EID: 0942267762     PISSN: 14644258     EISSN: None     Source Type: Journal    
DOI: 10.1088/1464-4258/6/1/022     Document Type: Article
Times cited : (18)

References (16)
  • 1
    • 0001101061 scopus 로고
    • Two-dimensional automatic straightness measurement system based on optical activity
    • Yin C, Chen W and Fang Z 1991 Two-dimensional automatic straightness measurement system based on optical activity Opt. Eng. 30 480-2
    • (1991) Opt. Eng. , vol.30 , pp. 480-482
    • Yin, C.1    Chen, W.2    Fang, Z.3
  • 2
    • 0020203020 scopus 로고
    • Optical alignment measurement at Goddard space flight center
    • Eichhorn W L 1982 Optical alignment measurement at Goddard space flight center Appl. Opt. 21 3891-5
    • (1982) Appl. Opt. , vol.21 , pp. 3891-3895
    • Eichhorn, W.L.1
  • 3
    • 0020722117 scopus 로고
    • Laser alignment techniques
    • Williams D C 1983 Laser alignment techniques Phys. Technol. 14 61-7
    • (1983) Phys. Technol. , vol.14 , pp. 61-67
    • Williams, D.C.1
  • 4
    • 0022767093 scopus 로고
    • Extensive analysis and development of straightness measurement by sequential-two-points-method
    • Tanaka H 1986 Extensive analysis and development of straightness measurement by sequential-two-points-method Trans. ASME 108 176-82
    • (1986) Trans. ASME , vol.108 , pp. 176-182
    • Tanaka, H.1
  • 5
    • 0020153956 scopus 로고
    • A new method for measurement of the straightness of machine tools and machined work
    • Koichi T 1982 A new method for measurement of the straightness of machine tools and machined work J. Mech. Design 104 587-92
    • (1982) J. Mech. Design , vol.104 , pp. 587-592
    • Koichi, T.1
  • 6
    • 0022059627 scopus 로고
    • Calibration and use of optical straightedge in the metrology of precision machines
    • Tyler Estler W 1988 Calibration and use of optical straightedge in the metrology of precision machines Opt. Eng. 24 372-9
    • (1988) Opt. Eng. , vol.24 , pp. 372-379
    • Tyler Estler, W.1
  • 7
    • 0023366233 scopus 로고
    • Measurement of straightness by means of overlap coupling of data
    • Shinji K and Kohji O 1987 Measurement of straightness by means of overlap coupling of data JSME Int. J. 30 992-5
    • (1987) JSME Int. J. , vol.30 , pp. 992-995
    • Shinji, K.1    Kohji, O.2
  • 8
    • 0008093965 scopus 로고    scopus 로고
    • The application of non-diffracting beam in a straightness error measuring system
    • in Chinese
    • Zhang Q, Zhao B and Li Z 1997 The application of non-diffracting beam in a straightness error measuring system J. Huazhong Univ. Sci. Technol. 25 1-3 (in Chinese)
    • (1997) J. Huazhong Univ. Sci. Technol. , vol.25 , pp. 1-3
    • Zhang, Q.1    Zhao, B.2    Li, Z.3
  • 9
    • 0036165082 scopus 로고    scopus 로고
    • Study of the tolerance of the non-diffracting beam to laser beam deflection
    • Zhang X-B, Zhao B and Li Z 2002 Study of the tolerance of the non-diffracting beam to laser beam deflection J. Opt. A: Pure Appl. Opt. 4 78-83
    • (2002) J. Opt. A: Pure Appl. Opt. , vol.4 , pp. 78-83
    • Zhang, X.-B.1    Zhao, B.2    Li, Z.3
  • 10
    • 0000893502 scopus 로고
    • Efficient generation of nearly diffraction-free beams using an axicon
    • Scott G and McArdie N 1992 Efficient generation of nearly diffraction-free beams using an axicon Opt. Eng. 31 2640-3
    • (1992) Opt. Eng. , vol.31 , pp. 2640-2643
    • Scott, G.1    McArdie, N.2
  • 11
    • 0014806264 scopus 로고
    • Moiré topography
    • Takasaki H 1970 Moiré topography Appl. Opt. 9 1457
    • (1970) Appl. Opt. , vol.9 , pp. 1457
    • Takasaki, H.1
  • 14
    • 0032697513 scopus 로고    scopus 로고
    • A new circle/ellipse detector using genetic algorithms
    • Yin P-Y 1999 A new circle/ellipse detector using genetic algorithms Pattern Recognit. Lett. 20 731-40
    • (1999) Pattern Recognit. Lett. , vol.20 , pp. 731-740
    • Yin, P.-Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.