Photoluminescence, depth profile, and lattice instability of hexagonal InN films

Applied Physics Letters

Volumn 83, Issue 26, 2003, Pages 5440-5442

  Semchinova, O K ^a   Aderhold, J ^a   Graul, J ^a   Filimonov, A ^b   Neff, H ^c,d  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^b PETER THE GREAT ST PETERSBURG POLYTECHNIC UNIVERSITY   (Russian Federation)

^c Vir AS   (Denmark)

^d FEDERAL UNIVERSITY OF CAMPINA GRANDE   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CRYSTAL GROWTH; CRYSTAL LATTICES; DENSITY (OPTICAL); ENERGY GAP; FILM GROWTH; HIGH ENERGY ELECTRON DIFFRACTION; MASS SPECTROMETRY; MOLECULAR BEAM EPITAXY; MOLECULAR DYNAMICS; PHOTOLUMINESCENCE; RAMAN SPECTROSCOPY; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING INDIUM COMPOUNDS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ENERGY TRANSITION; EPITAXIAL FILMS; LATTICE INSTABILITY;

SEMICONDUCTING FILMS;

EID: 0942266927     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1634691     Document Type: Article

References (15)

1. B. E. Foutz, S. K. O'Leary, M. S. Shur, and L. F. Eastman, J. Appl. Phys. 85, 916 (1999).
2. O. K. Semchinova, V. Alexandrov, D. Uffmann, and H. Neff, Mater. Res. Soc. Symp. Proc. 468, 57 (1997), and H. Neff, DE 19715761.0 (patent pending).
3. O. K. Semchinova, V. Alexandrov, D. Uffmann, and H. Neff, Mater. Res. Soc. Symp. Proc. 468, 57 (1997), and H. Neff, DE 19715761.0 (patent pending).
4. T. Inushima, V. V. Mamutin, V. A. Vekshin, S. V. Ivanov, T. Sakon, M. Motokawa, and S. Ohoya, J. Cryst. Growth 227, 481 (2001).
5. S. Strite and H. Morkoc, J. Vac. Sci. Technol. B 10, 1247 (1992).
6. T. L. Tansley and C. P. Foley, J. Appl. Phys. 59, 4241 (1986).
7. T. Beierlein, S. Strite, A. Dommann, and D. J. Smith, MRS Internet J. Nitride Semicond. Res. 2, 29 (1997).
8. H. Lu, W. J. Schaff, J. Hwang, H. Wu, G. Koley, and L. F. Eastman, Appl. Phys. Lett. 79, 1489 (2001).
9. V. Yu. Davydov, A. A. Klochikhin, R. P. Seishan, V. V. Emtsev, S. V. Ivanov, F. Bechstedt, J. Furthmüller, H. Harma, A. V. Murdry, J. Aderhold, O. Semchinova, and J. Graul, Phys. Status Solidi B 229, R1 (2002).
10. J. Wu, W. Walukiewicz, K. M. Yu, J. W. Ager III, E. E. Haller, H. Lu, W. J. Schaff, Y. Saito, and Y. Nanishi, Appl. Phys. Lett. 80, 4967 (2002).
11. J. Aderhold, V. Yu. Davydov, F. Fedler, H. Klausing, D. Mistele, T. Rotter, O. Semchinova, J. Stemmer, and J. Graul, J. Cryst. Growth 222, 701 (2001).
12. I. Motlan and E. M. Goldys, J. Cryst. Growth 241, 165 (2002).
13. S. Matsuma, T. Inushima, and T. Shiraishi, J. Cryst. Growth 189/190, 696 (1996).
14. N. Saito, Appl. Surf. Sci. 169, 449 (2001).
15. J. F. Silvain and T. Carney, Thin Solid Films 330, 132 (1998).