Measurement of the microwave dielectric constant for low-loss samples with finite thickness using open-ended coaxial-line probes

Review of Scientific Instruments

Volumn 64, Issue 6, 1993, Pages 1622-1626

  Jiang, G Q ^a   Wong, W H ^a   Raskovich, E Y ^a   Clark, W G ^a   Hines, W A ^b   Sanny, J ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF CONNECTICUT   (United States)

^c LOYOLA MARYMOUNT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0942266726     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1144036     Document Type: Article

References (8)