Investigating X-ray Bragg-Line Displacement as a Technique for Determination of the Thermal Expansion Coefficient of Solid Samples

Materials Science Forum

Volumn 443-444, Issue , 2004, Pages 151-154

  Battaglia, S ^a   Mango, F ^b  

^a CNR   (Italy)

^b INFM   (Italy)

Author keywords

Diffraction; Thermal Expansion; Thin Layer; X Ray

Indexed keywords

AMORPHOUS SILICON; COMPUTER SOFTWARE; DIFFRACTOMETERS; GONIOMETERS; HEAT LOSSES; METAL FOIL; ROCKS; SCINTILLATION COUNTERS; THERMAL CONDUCTIVITY; X RAYS;

BRAGG DIFFRACTION; THERMAL EXPANSION COEFFICIENTS (TEC); THIN LAYER;

THERMAL EXPANSION;

EID: 0842326599     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.443-444.151     Document Type: Conference Paper

References (8)

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