Effect of "surface" triple junction on curved boundary motion in Al-bicrystals

Acta Materialia

Volumn 52, Issue 4, 2004, Pages 969-975

  Ivanov, V A ^a   Molodov, D A ^a   Shvindlerman, L S ^a,b   Gottstein, G ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

Author keywords

Grain boundary; Migration; Mobility; Triple junction

Indexed keywords

ALUMINUM; BACKSCATTERING; BOUNDARY ELEMENT METHOD; CRYSTAL DEFECTS; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; CRYSTALS; INTERFACIAL ENERGY; SCANNING ELECTRON MICROSCOPY; TEMPERATURE MEASUREMENT; VELOCITY MEASUREMENT;

MIGRATION; MOBILITY; TRIPLE JUNCTION;

GRAIN BOUNDARIES;

EID: 0742307267     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2003.10.031     Document Type: Article

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