New techniques of characterisation

Comptes Rendus Physique

Volumn 4, Issue 10, 2003, Pages 1175-1185

  Guérineau, Nicolas ^a   Rommeluere, Sylvain ^a   Di Mambro, Emmanuel ^a   Ribet, Isabelle ^a   Primot, Jérôme ^a  

^a ONERA   (France)

Author keywords

Infrared focal plane arrays; Metrology; MTF; Spectrometry; Talbot

Indexed keywords

EID: 0742289420     PISSN: 16310705     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.crhy.2003.10.019     Document Type: Short Survey

References (20)

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