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Applied Physics A: Materials Science and Processing

Volumn 78, Issue 2, 2004, Pages 189-199

Photon-assisted tunneling versus tunneling of excited electrons in metal-insulator-metal junctions

(6) Thon, A a Merschdorf, M a Pfeiffer, W a Klamroth, T b Saalfrank, P b Diesing, D c

a UNIVERSITY OF WÜRZBURG (Germany)

b UNIVERSITY OF POTSDAM (Germany)

c FORSCHUNGSZENTRUM JÜLICH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC DENSITY OF STATES; ELECTRONS; OSCILLATIONS; PERTURBATION TECHNIQUES; PHOTOCURRENTS; PHOTONS; SILVER COMPOUNDS; ULTRASHORT PULSES;

METAL-INSULATOR-METAL-JUNCTIONS; PHOTON-ASSISTED TUNNELING;

SEMICONDUCTOR JUNCTIONS;

EID: 0742268560 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s00339-003-2314-2 Document Type: Article

Times cited : (31)

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