Properties of vanadium-doped SrBi4Ti4O15 ferroelectric ceramics

Solid State Communications

Volumn 129, Issue 11, 2004, Pages 707-710

  Zhu, Jun ^a,b   Mao, Xiang Yu ^a   Chen, Xiao Bing ^a,b  

^a YANGZHOU UNIVERSITY   (China)

^b NANJING UNIVERSITY   (China)

Author keywords

A. Ferroelectrics; B. Solid state reaction; C. X ray diffraction; D. Electric breakdown voltage; D. Remnant polarization

Indexed keywords

CONCENTRATION (PROCESS); CRYSTAL STRUCTURE; DOPING (ADDITIVES); ELECTRIC BREAKDOWN; ELECTRIC FIELDS; ELECTRIC POTENTIAL; EXTRAPOLATION; MAGNETIC HYSTERESIS; MOLECULAR ORIENTATION; PEROVSKITE; POSITIVE IONS; REMANENCE; STRONTIUM COMPOUNDS; SYNTHESIS (CHEMICAL); THERMODYNAMIC STABILITY; X RAY DIFFRACTION;

ELECTRIC BREAKDOWN VOLTAGE; REMNANT POLARIZATION; SOLID-STATE REACTIONS;

FERROELECTRIC CERAMICS;

EID: 0742268522     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2003.12.024     Document Type: Article

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