Temperature and bias dependence of dynamic conductance - Low resistive magnetic tunnel junctions

Journal of Applied Physics

Volumn 95, Issue 2, 2004, Pages 546-550

  Oliver, Bryan ^a   Nowak, Janusz ^a  

^a SEAGATE TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON HOPPING; OHMIC CONDUCTORS;

ALUMINA; ALUMINUM; ELECTRIC CONDUCTANCE; ELECTRIC CONDUCTORS; ELECTRIC POTENTIAL; ELECTRODES; ELECTRON TUNNELING; LITHOGRAPHY; MAGNETIC DEVICES; MAGNETIZATION; MAGNETRON SPUTTERING; OXIDATION; QUANTUM THEORY;

TUNNEL JUNCTIONS;

EID: 0742268448     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1631074     Document Type: Article

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