Built-in self-repair for divided word line memory

ISCAS 2001 - 2001 IEEE International Symposium on Circuits and Systems, Conference Proceedings

Volumn 4, Issue , 2001, Pages 13-16

  Lu, Shyue Kung ^a   Hsu, Chih Hsien ^a  

^a FU JEN CATHOLIC UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF-REPAIR; FAULT-TOLERANT ARCHITECTURES; HARDWARE OVERHEADS; HIGH-CAPACITY MEMORY; MEMORY CELL ARRAYS; REPAIR RATE;

DYNAMIC RANDOM ACCESS STORAGE; STATIC RANDOM ACCESS STORAGE;

REPAIR;

EID: 0742267423     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2001.922156     Document Type: Conference Paper

References (9)

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