Characterization of different length scales and periodicities in Ge/Si microstructures by Raman spectroscopy : Theory and experiment

Journal of Raman Spectroscopy

Volumn 27, Issue 3-4, 1996, Pages 257-263

  Araujo Silva M A ^a,c   Ribeiro, E ^a   Schulz, P A ^a   Cerdeira, F ^a   Bean, J C ^b  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b LUCENT TECHNOLOGIES   (United States)

^c FEDERAL UNIVERSITY OF CEARÁ   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

BOND POLARIZABILITY; CHAIN MODELS; DIFFERENT LENGTH SCALE; EXPERIMENTAL SPECTRA; LINEAR CHAIN; RAMAN INTENSITIES; SIMULATED SPECTRA; SPECTROSCOPY/THEORY; THEORETICAL SPECTRA; WAVE NUMBERS;

MONOLAYERS;

EID: 0642380078     PISSN: 03770486     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1097-4555(199603)27:3/4<257::aid-jrs954>3.0.co;2-o     Document Type: Article

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