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Volumn 5, Issue 2, 1993, Pages 191-198
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Coulomb gap measurement in non-compensated Si:As
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0642359243
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/5/2/007 Document Type: Article |
Times cited : (11)
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References (22)
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