Investigations on Bøggild intergrowth of intermediate plagioclase by high resolution transmission electron microscopy

Zeitschrift fur Kristallographie

Volumn 211, Issue 12, 1996, Pages 879-883

  Hoshi, T ^a   Tagai, T ^a   Suzuki, M ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Analytical TEM; B ggild intergrowth; Intermediate plagioclase

Indexed keywords

EID: 0642348481     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (23)

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