Influence of low energy ballistic electron on the transmittance properties of Au/Si interface studied by ballistic-electron-emission microscope

Chinese Science Bulletin

Volumn 42, Issue 15, 1997, Pages 1282-1286

  Qiu, Xiaohui ^a   Shang, Guangyi ^a   Wang, Chen ^a   Wang, Naixin ^a   Bai, Chunli ^a  

^a INSTITUTE OF CHEMISTRY   (China)

Author keywords

Au Si interface; Ballistic electron emission microscopy; Transmittance probability

Indexed keywords

EID: 0642332427     PISSN: 10016538     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02882760     Document Type: Article

References (12)

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