Electrical resistivity of bismuth implanted into silicon

Journal of Applied Physics

Volumn 79, Issue 7, 1996, Pages 3453-3455

  Da Silva, A Ferreira ^a   Sernelius, Bo E ^b   De Souza, J P ^c   Boudinov, H ^c  

^a INSTITUTO NACIONAL DE PESQUISAS ESPACIAIS   (Brazil)

^b LINKÖPING UNIVERSITY   (Sweden)

^c FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0642329915     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361393     Document Type: Article

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