The Time-of-Flight Small-Angle Neutron Diffractometer (SAD) at IPNS, Argonne National Laboratory

Journal of Applied Crystallography

Volumn 30, Issue 3, 1997, Pages 280-293

  Thiyagarajan, P ^a   Epperson, J E ^a,b   Crawford, R K ^a   Carpenter, J M ^a   Klippert, T E ^a,c   Wozniak, D G ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b APS Division

^c Material Science Division

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0642303347     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889896013398     Document Type: Article

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