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Volumn 57, Issue 8, 1998, Pages 4708-4712
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Characterization of normal and inverted interfaces by the Zeeman effect in quantum wells
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0542443292
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.57.4708 Document Type: Article |
Times cited : (15)
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References (10)
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