Structural and magnetic properties of Fe/Rh(001) sputter deposited multilayers

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 16, Issue 3, 1998, Pages 1336-1341

  Tomaz, M A ^a   Harp, G R ^a   Mayo, E ^b   Lederman, D ^b   Wu, R ^c   O'Brien, W L ^d  

^a OHIO UNIVERSITY   (United States)

^b WEST VIRGINIA UNIVERSITY   (United States)

^c CALIFORNIA STATE UNIVERSITY   (United States)

^d UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0542428957     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581147     Document Type: Article

References (22)

1. M. A. Tomaz, D. C. Ingram, G. R. Harp, D. Lederman, E. Mayo, and W. L. O'Brien, Phys. Rev. B 56, 5474 (1997).
2. T. Kachel, W. Gudat, C. Carbone, E. Vescovo, S. Blügel, U. Alkemper, and W. Eberhardt, Phys. Rev. B 46, 12 888 (1992).
3. 50 alloy lattice constant.
4. The interplanar spacing is calculated by conserving the atomic volume.
5. G. Schütz, W. Wagner, W. Wilhelm, P. Keinle, R. Zeller, R. Frahm, and G. Materlik, Phys. Rev. Lett. 58, 737 (1987).
6. O. Hjortstam, J. Trygg, J. M. Wills, B. Johansson, and O. Eriksson, Phys. Rev. B 53, 9204 (1996). and references therein.
7. See 3d, 4d, and 5d Elements, Alloys, and Compounds, edited by H. P. J. Wijn, Landolt-Börnstein, New Series, Group 3, Vol. 19, Pt. A (Springer, Berlin, 1986) for a compilation of magnetic alloy work.
8. G. Shirane, R. Nathans, and C. W. Chen. Phys. Rev. 134, A1547 (1964).
9. E. E. Fullerton, D. Stoeffler, K. Ounadjela, B. Heinrich, Z. Celinski, and J. A. C. Bland, Phys. Rev. B 51, 6364 (1995).
10. J. Vogel, A. Fontaine, V. Cros, F. Petroff, J-P Kappler, G. Krill, A. Rogalev, and J. Goulon, Phys. Rev. B 55, 3663 (1997).
11. M. A. Tomaz, G. R. Harp, E. Hallin, T. K. Sham, and W. L. O'Brien, Phys. Rev. B (submitted).
12. M. A. Tomaz, W. J. Antel, W. L. O'Brien, and G. R. Harp, Phys. Rev. B 55, 3716 (1997).
13. M. A. Tomaz, W. J. Antel, W. L. O'Brien, and G. R. Harp, J. Phys.: Condens. Matter 9, L179 (1997).
14. W. Keune, R. Halbauer, U. Gonser, J. Lauer, and D. L. Williamson, J. Appl. Phys. 48, 2976 (1977).
15. J. A. C. Bland, D. Pescia, and R. F. Willis, Phys. Rev. Lett. 58, 1244 (1987), and references therein.
16. S. S. Peng and H. J. F. Hansen, Ultramicroscopy 47, 361 (1992).
17. R. Wu and A. J. Freeman, Ultramicroscopy 47, 361 (1992).
18. R. Wu and A. J. Freeman, Ultramicroscopy 47, 361 (1992).
19. H. Itoh, J. Inoue, and S. Maekawa, Phys. Rev. B 47, 5809 (1993).
20. L. Zhong and A. J. Freeman, J. Appl. Phys. 81, 3890 (1997).
21. The intermixed interface is based on the assumption that the intermixing is well represented by a linear profile. This means that for a 2.27 Å intermixed interface, the Rh concentration goes from 0% to 100% in 2.27 Å.
22. M. A. Tomaz, G. R. Harp, E. Hallin, T. K. Sham, and W. L. O'Brien, J. Vac. Sci. Technol. A (submitted).