Zero bias resistance dip in the characteristics of YBa2Cu3O7-x thin film microbridges

Czechoslovak Journal of Physics

Volumn 46, Issue SUPPL. 3, 1996, Pages 1315-1316

  Dostanko, Anatolij P ^a   Pogrebnyakov, Alexej V ^a   Levinsen, Mogens T ^b   Sheng, Yue Q ^c   Freltoft, Torsten ^c  

^a BELARUSIAN STATE UNIVERSITY OF INFORMATICS AND RADIOELECTRONICS   (Belarus)

^b UNIVERSITY OF COPENHAGEN   (Denmark)

^c NKT Research & Innovation AS   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0542423487     PISSN: 00114626     EISSN: 15729486     Source Type: Journal    
DOI: 10.1007/BF02562772     Document Type: Article

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