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Turkish Journal of Physics

Volumn 22, Issue 6, 1998, Pages 453-459

The Determination of Thermal Annealing Effect on the DOS Profile of a-Si:H Film

(1) Serin, Tülay a

a ANKARA UNIVERSITY (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0542398492 PISSN: 13000101 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (1)

References (24)

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