Low-energy-electron-diffraction study of the As-stabilized Si(111) “ surface

Physical Review B - Condensed Matter and Materials Physics

Volumn 57, Issue 8, 1998, Pages 4776-4781

  Yasuda, Haruyuki ^a   Hasegawa, Shigehiko ^a   Maruyama, Masakatsu ^a   Abe, Daisuke ^a   Nakashima, Hisao ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0542371842     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.57.4776     Document Type: Article

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