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Volumn 39, Issue 2, 2004, Pages 719-721
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On the accuracy of the X-ray diffraction quantitative phases analysis method in inconel 718
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Author keywords
[No Author keywords available]
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Indexed keywords
ABSORPTION SPECTROSCOPY;
AGING OF MATERIALS;
COLD ROLLING;
COMPOSITION;
CRYSTAL STRUCTURE;
CURRENT DENSITY;
ELECTROLYSIS;
ETCHING;
INDUCTIVELY COUPLED PLASMA;
LATTICE CONSTANTS;
PRECIPITATION (CHEMICAL);
REDUCTION;
SOLUTIONS;
SUPERALLOYS;
X RAY DIFFRACTION;
PHASE ANALYSIS;
SELECTIVE ELECTROLYSIS;
NICKEL ALLOYS;
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EID: 0442326567
PISSN: 00222461
EISSN: None
Source Type: Journal
DOI: 10.1023/B:JMSC.0000011540.61546.73 Document Type: Article |
Times cited : (20)
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References (7)
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