On the fundamental relations used in the analysis of nanoindentation data

Journal of Materials Science

Volumn 39, Issue 2, 2004, Pages 745-746

  Fu, Guanghui ^a  

^a LAM RESEARCH CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; ELASTIC MODULI; FRICTION; POISSON RATIO; STIFFNESS; THIN FILMS;

CONTACT STIFFNESS; NANOINDENTATION;

INDENTATION;

EID: 0442326565     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JMSC.0000011547.59966.e4     Document Type: Article

References (2)

1. G. M. PHARR, W. C. OLIVER and F. R. BROTZEN, J. Mater. Res. 7 (1992) 613.
2. G. FU and A. CHANDRA, J. Appl. Mech. ASME 69 (2002) 142.