A modified two-scale scattering model for randomly rough surface. I. the scattering field and the scattering coefficient

ISAPE 2000 - 2000 5th International Symposium on Antennas, Propagation and EM Theory, Proceedings

Volumn , Issue , 2000, Pages 390-393

  Liu, Ning ^a   Li, Zong Qian ^a   Weng, Hai Xiao ^a   Chen, Li Qing ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER ANALYSIS; FOURIER SERIES; LOW PASS FILTERS; SURFACE MEASUREMENT;

BISTATIC SCATTERING; FOURIER COEFFICIENTS; RANDOMLY ROUGH SURFACES; SCATTERING CHAR-ACTERISTICS; SCATTERING CO-EFFICIENT; SCATTERING MODEL; STATISTICAL CHARACTERISTICS; SURFACE HEIGHT FUNCTION;

SURFACE SCATTERING;

EID: 0442319388     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISAPE.2000.894806     Document Type: Conference Paper

References (6)

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3. Adrian K. Fung, Microwave Scattering and Emission Models and their Applications, Atech House, Inc., 1994.
4. Grays. Brown, "Backscattering from a Gaussian-Distributed Perfectly Conduction Rough Surface", IEEE Trans. On Antennas and Propagation, Vol. AP-26, No. 3, May, 1978, pp472-pp481.
5. Wolfgang Dieking, "Quantitative Roughness Characterization of Geological Surface and Implications for Radar Signature Analysis", IEEE Trans. On Geoscience and Remote Sensing , Vol. 37, No. 5, September, 1999
6. Dajin Lu, Stochastic Process, Tsinghua University Publishing Company, 1995.