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Volumn 150, Issue 2, 2004, Pages 409-416

On steady state availability of a system with lognormal repair time

Author keywords

Confidence intervals; Lognormal repair times; Steady state availability

Indexed keywords

COMPUTER SIMULATION; PERFORMANCE; RANDOM PROCESSES; STATISTICAL TESTS; WEIBULL DISTRIBUTION;

EID: 0442311847     PISSN: 00963003     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0096-3003(03)00281-9     Document Type: Article
Times cited : (20)

References (15)
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    • Ananda M.M.A. Estimation and testing of availability of a parallel system with exponential failure and repair times. Journal of Statistical Planning and Inference. 77:1999;237-246.
    • (1999) Journal of Statistical Planning and Inference , vol.77 , pp. 237-246
    • Ananda, M.M.A.1
  • 4
    • 0031483783 scopus 로고    scopus 로고
    • Two-way ANOVA with unequal cell frequencies and unequal variances
    • Ananda M.M.A., Weerahandi S. Two-way ANOVA with unequal cell frequencies and unequal variances. Statistica Sinica. 7:1997;631-646.
    • (1997) Statistica Sinica , vol.7 , pp. 631-646
    • Ananda, M.M.A.1    Weerahandi, S.2
  • 7
    • 0011703297 scopus 로고
    • A confidence interval for the availability ratio
    • Gray H.L., Lewis T.O. A confidence interval for the availability ratio. Technometrics. 9:1967;465-471.
    • (1967) Technometrics , vol.9 , pp. 465-471
    • Gray, H.L.1    Lewis, T.O.2
  • 8
    • 0014602511 scopus 로고
    • Lower confidence limits for availability assuming lognormally distributed repair times
    • Gray H.L., Schucany W.R. Lower confidence limits for availability assuming lognormally distributed repair times. IEEE Transactions on Reliability. R-18:1969;157-162.
    • (1969) IEEE Transactions on Reliability , vol.R-18 , pp. 157-162
    • Gray, H.L.1    Schucany, W.R.2
  • 10
    • 38249037303 scopus 로고
    • A note on the confidence interval for the availability ratio
    • Masters B.N., Lewis T.O. A note on the confidence interval for the availability ratio. Microelectronics and Reliability. 27(3):1987;487-492.
    • (1987) Microelectronics and Reliability , vol.27 , Issue.3 , pp. 487-492
    • Masters, B.N.1    Lewis, T.O.2
  • 11
    • 0026711969 scopus 로고
    • A confidence interval for the availability ratio for systems with weibull operating time and lognormal repair time
    • Masters B.N., Lewis T.O., Kolarik W.J. A confidence interval for the availability ratio for systems with weibull operating time and lognormal repair time. Microelectronics and Reliability. 32(1/2):1992;89-99.
    • (1992) Microelectronics and Reliability , vol.32 , Issue.1-2 , pp. 89-99
    • Masters, B.N.1    Lewis, T.O.2    Kolarik, W.J.3
  • 13
    • 0000440236 scopus 로고
    • Generalized p -values in significance testing of hypotheses in the presence of nuisance parameters
    • Tsui K., Weerahandi S. Generalized. p -values in significance testing of hypotheses in the presence of nuisance parameters Journal of the American Statistical Association. 84:1989;602-607.
    • (1989) Journal of the American Statistical Association , vol.84 , pp. 602-607
    • Tsui, K.1    Weerahandi, S.2
  • 15
    • 0026821240 scopus 로고
    • Testing reliability in a stress-strength model when X and Y are normally distributed
    • Weerahandi S., Johnson R.A. Testing reliability in a stress-strength model when. X and Y are normally distributed Technometrics. 34:1992;83-91.
    • (1992) Technometrics , vol.34 , pp. 83-91
    • Weerahandi, S.1    Johnson, R.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.