-
1
-
-
0011643725
-
Estimation and testing of availability of a parallel system with exponential failure and repair times
-
Ananda M.M.A. Estimation and testing of availability of a parallel system with exponential failure and repair times. Journal of Statistical Planning and Inference. 77:1999;237-246.
-
(1999)
Journal of Statistical Planning and Inference
, vol.77
, pp. 237-246
-
-
Ananda, M.M.A.1
-
4
-
-
0031483783
-
Two-way ANOVA with unequal cell frequencies and unequal variances
-
Ananda M.M.A., Weerahandi S. Two-way ANOVA with unequal cell frequencies and unequal variances. Statistica Sinica. 7:1997;631-646.
-
(1997)
Statistica Sinica
, vol.7
, pp. 631-646
-
-
Ananda, M.M.A.1
Weerahandi, S.2
-
7
-
-
0011703297
-
A confidence interval for the availability ratio
-
Gray H.L., Lewis T.O. A confidence interval for the availability ratio. Technometrics. 9:1967;465-471.
-
(1967)
Technometrics
, vol.9
, pp. 465-471
-
-
Gray, H.L.1
Lewis, T.O.2
-
8
-
-
0014602511
-
Lower confidence limits for availability assuming lognormally distributed repair times
-
Gray H.L., Schucany W.R. Lower confidence limits for availability assuming lognormally distributed repair times. IEEE Transactions on Reliability. R-18:1969;157-162.
-
(1969)
IEEE Transactions on Reliability
, vol.R-18
, pp. 157-162
-
-
Gray, H.L.1
Schucany, W.R.2
-
10
-
-
38249037303
-
A note on the confidence interval for the availability ratio
-
Masters B.N., Lewis T.O. A note on the confidence interval for the availability ratio. Microelectronics and Reliability. 27(3):1987;487-492.
-
(1987)
Microelectronics and Reliability
, vol.27
, Issue.3
, pp. 487-492
-
-
Masters, B.N.1
Lewis, T.O.2
-
11
-
-
0026711969
-
A confidence interval for the availability ratio for systems with weibull operating time and lognormal repair time
-
Masters B.N., Lewis T.O., Kolarik W.J. A confidence interval for the availability ratio for systems with weibull operating time and lognormal repair time. Microelectronics and Reliability. 32(1/2):1992;89-99.
-
(1992)
Microelectronics and Reliability
, vol.32
, Issue.1-2
, pp. 89-99
-
-
Masters, B.N.1
Lewis, T.O.2
Kolarik, W.J.3
-
13
-
-
0000440236
-
Generalized p -values in significance testing of hypotheses in the presence of nuisance parameters
-
Tsui K., Weerahandi S. Generalized. p -values in significance testing of hypotheses in the presence of nuisance parameters Journal of the American Statistical Association. 84:1989;602-607.
-
(1989)
Journal of the American Statistical Association
, vol.84
, pp. 602-607
-
-
Tsui, K.1
Weerahandi, S.2
-
15
-
-
0026821240
-
Testing reliability in a stress-strength model when X and Y are normally distributed
-
Weerahandi S., Johnson R.A. Testing reliability in a stress-strength model when. X and Y are normally distributed Technometrics. 34:1992;83-91.
-
(1992)
Technometrics
, vol.34
, pp. 83-91
-
-
Weerahandi, S.1
Johnson, R.A.2
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